Large Scale Mask Optimization Via Convolutional Fourier Neural Operator and Litho-Guided Self Training
About
Machine learning techniques have been extensively studied for mask optimization problems, aiming at better mask printability, shorter turnaround time, better mask manufacturability, and so on. However, most of these researches are focusing on the initial solution generation of small design regions. To further realize the potential of machine learning techniques on mask optimization tasks, we present a Convolutional Fourier Neural Operator (CFNO) that can efficiently learn layout tile dependencies and hence promise stitch-less large-scale mask optimization with the limited intervention of legacy tools. We discover the possibility of litho-guided self-training (LGST) through a trained machine learning model when solving non-convex optimization problems, which allows iterative model and dataset update and brings significant model performance improvement. Experimental results show that, for the first time, our machine learning-based framework outperforms state-of-the-art academic numerical mask optimizers with an order of magnitude speedup.
Related benchmarks
| Task | Dataset | Result | Rank | |
|---|---|---|---|---|
| Inverse Lithography | ICCAD 2013 (Avg) | EPE8.5 | 17 | |
| Inverse Lithography Technology | LithoBench MetalSet Metal Layer | L2 Error4.78e+4 | 12 | |
| Inverse Lithography Technology | LithoBench StdMetal Metal Layer In-distribution | L2 Error2.68e+4 | 12 | |
| Inverse Lithography Technology | LithoBench ViaSet Via Layer | L2 Error8.95e+3 | 11 | |
| Inverse Lithography Technology | LithoBench StdContact (Via Layer, OOD) | L2 Error (Via Layer OOD)7.07e+4 | 11 | |
| Mask Optimization | ICCAD contest benchmark 2013 (test) | L2 Error4.34e+4 | 10 | |
| Mask Generation (OPC) | LithoBench ViaSet 45 nm via-layer ILT (test) | L2 Error2.03e+4 | 5 | |
| Mask Generation (OPC) | MaskOpt ILT 45 nm metal-layer (test) | L2 Error6.20e+4 | 5 | |
| Mask Generation (OPC) | GAN-OPC synthetic 32 nm M1 (test) | L2 Distance9.02e+3 | 5 | |
| Mask Generation (OPC) | LithoBench MetalSet 32 nm metal-layer ILT (test) | L2 Error4.34e+4 | 5 |