XOOD: Extreme Value Based Out-Of-Distribution Detection For Image Classification
About
Detecting out-of-distribution (OOD) data at inference time is crucial for many applications of machine learning. We present XOOD: a novel extreme value-based OOD detection framework for image classification that consists of two algorithms. The first, XOOD-M, is completely unsupervised, while the second XOOD-L is self-supervised. Both algorithms rely on the signals captured by the extreme values of the data in the activation layers of the neural network in order to distinguish between in-distribution and OOD instances. We show experimentally that both XOOD-M and XOOD-L outperform state-of-the-art OOD detection methods on many benchmark data sets in both efficiency and accuracy, reducing false-positive rate (FPR95) by 50%, while improving the inferencing time by an order of magnitude.
Related benchmarks
| Task | Dataset | Result | Rank | |
|---|---|---|---|---|
| OOD Detection | MVTec Metal Nut Dissimilar | AUROC0.6693 | 90 | |
| OOD Detection | MVTec Pill (Similar) | AUROC75.71 | 90 | |
| OOD Detection | MVTec Pill (Dissimilar) | AUROC68.84 | 90 | |
| OOD Detection | ISIC Ink Artefacts (Similar) | AUROC80.76 | 70 | |
| OOD Detection | ISIC Colour Chart Artefacts Synth Similar | AUROC0.9054 | 40 | |
| OOD Detection | ISIC Colour Chart Artefacts, Synth Dissimilar | AUROC87.45 | 40 | |
| OOD Detection | ISIC Colour Chart Artefacts Similar | AUROC88.5 | 40 | |
| OOD Detection | ISIC Colour Chart Artefacts (Dissimilar) | AUROC0.8481 | 40 | |
| OOD Detection | ISIC Ink Artefacts (Dissimilar) | AUROC63.91 | 40 | |
| OOD Detection | ISIC Ink Artefacts Similar (test) | FPR@TPR8030 | 30 |