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XOOD: Extreme Value Based Out-Of-Distribution Detection For Image Classification

About

Detecting out-of-distribution (OOD) data at inference time is crucial for many applications of machine learning. We present XOOD: a novel extreme value-based OOD detection framework for image classification that consists of two algorithms. The first, XOOD-M, is completely unsupervised, while the second XOOD-L is self-supervised. Both algorithms rely on the signals captured by the extreme values of the data in the activation layers of the neural network in order to distinguish between in-distribution and OOD instances. We show experimentally that both XOOD-M and XOOD-L outperform state-of-the-art OOD detection methods on many benchmark data sets in both efficiency and accuracy, reducing false-positive rate (FPR95) by 50%, while improving the inferencing time by an order of magnitude.

Frej Berglind, Haron Temam, Supratik Mukhopadhyay, Kamalika Das, Md Saiful Islam Sajol, Sricharan Kumar, Kumar Kallurupalli• 2022

Related benchmarks

TaskDatasetResultRank
OOD DetectionMVTec Metal Nut Dissimilar
AUROC0.6693
90
OOD DetectionMVTec Pill (Similar)
AUROC75.71
90
OOD DetectionMVTec Pill (Dissimilar)
AUROC68.84
90
OOD DetectionISIC Ink Artefacts (Similar)
AUROC80.76
70
OOD DetectionISIC Colour Chart Artefacts Synth Similar
AUROC0.9054
40
OOD DetectionISIC Colour Chart Artefacts, Synth Dissimilar
AUROC87.45
40
OOD DetectionISIC Colour Chart Artefacts Similar
AUROC88.5
40
OOD DetectionISIC Colour Chart Artefacts (Dissimilar)
AUROC0.8481
40
OOD DetectionISIC Ink Artefacts (Dissimilar)
AUROC63.91
40
OOD DetectionISIC Ink Artefacts Similar (test)
FPR@TPR8030
30
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