Hierarchical Fine-Grained Image Forgery Detection and Localization
About
Differences in forgery attributes of images generated in CNN-synthesized and image-editing domains are large, and such differences make a unified image forgery detection and localization (IFDL) challenging. To this end, we present a hierarchical fine-grained formulation for IFDL representation learning. Specifically, we first represent forgery attributes of a manipulated image with multiple labels at different levels. Then we perform fine-grained classification at these levels using the hierarchical dependency between them. As a result, the algorithm is encouraged to learn both comprehensive features and inherent hierarchical nature of different forgery attributes, thereby improving the IFDL representation. Our proposed IFDL framework contains three components: multi-branch feature extractor, localization and classification modules. Each branch of the feature extractor learns to classify forgery attributes at one level, while localization and classification modules segment the pixel-level forgery region and detect image-level forgery, respectively. Lastly, we construct a hierarchical fine-grained dataset to facilitate our study. We demonstrate the effectiveness of our method on $7$ different benchmarks, for both tasks of IFDL and forgery attribute classification. Our source code and dataset can be found: \href{https://github.com/CHELSEA234/HiFi_IFDL}{github.com/CHELSEA234/HiFi-IFDL}.
Related benchmarks
| Task | Dataset | Result | Rank | |
|---|---|---|---|---|
| Image Manipulation Localization | NIST16 | F1 Score86.9 | 75 | |
| Image Manipulation Localization | Coverage | -- | 49 | |
| Deepfake Detection | Celeb-DF | ROC-AUC0.688 | 44 | |
| Manipulation Localization | FFHQ OOD 1.0 | F1 Score0.063 | 36 | |
| Tamper Localization | Columbia | IoU6 | 28 | |
| Image-level Forgery Detection | Columbia | F1 Score64.4 | 24 | |
| Tamper Localization | DSO | IoU18 | 22 | |
| Tamper Localization | CASIA 1+ | IoU13 | 22 | |
| Tamper Localization | IMD 2020 | IoU9 | 22 | |
| Tamper Localization | NIST | IoU9 | 22 |