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Learning to Edit: Aligning LLMs with Knowledge Editing

About

Knowledge editing techniques, aiming to efficiently modify a minor proportion of knowledge in large language models (LLMs) without negatively impacting performance across other inputs, have garnered widespread attention. However, existing methods predominantly rely on memorizing the updated knowledge, impeding LLMs from effectively combining the new knowledge with their inherent knowledge when answering questions. To this end, we propose a Learning to Edit (LTE) framework, focusing on teaching LLMs to apply updated knowledge into input questions, inspired by the philosophy of "Teach a man to fish." LTE features a two-phase process: (i) the Alignment Phase, which fine-tunes LLMs on a meticulously curated parallel dataset to make reliable, in-scope edits while preserving out-of-scope information and linguistic proficiency; and (ii) the Inference Phase, which employs a retrieval-based mechanism for real-time and mass knowledge editing. By comparing our approach with seven advanced baselines across four popular knowledge editing benchmarks and two LLM architectures, we demonstrate LTE's superiority in knowledge editing performance, robustness in both batch and sequential editing, minimal interference on general tasks, and rapid editing speeds. The data and code are available at https://github.com/YJiangcm/LTE.

Yuxin Jiang, Yufei Wang, Chuhan Wu, Wanjun Zhong, Xingshan Zeng, Jiahui Gao, Liangyou Li, Xin Jiang, Lifeng Shang, Ruiming Tang, Qun Liu, Wei Wang• 2024

Related benchmarks

TaskDatasetResultRank
Knowledge EditingCounterFact
Efficacy95.31
301
Knowledge EditingzsRE--
181
Lifelong Knowledge EditingE-VQA Lifelong Sequential
Rel. Score95.74
72
Knowledge EditingMMEdit E-VQA
Reliability95.74
61
Knowledge EditingVLKEB
Reliability94.42
45
Knowledge EditingCounterfact uns
Edit Success Rate91.48
30
Knowledge EditingWikiUpdate
Edit Success80.21
30
Knowledge EditingMQuAKE
Edit Success Rate97.73
30
Knowledge EditingMzsRE Edit: EN, Test: EN
Reliability99.78
23
Knowledge EditingMMEdit E-IC
Reliability93.6
22
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Code

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