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Simultaneous Enhancement and Noise Suppression under Complex Illumination Conditions

About

Under challenging light conditions, captured images often suffer from various degradations, leading to a decline in the performance of vision-based applications. Although numerous methods have been proposed to enhance image quality, they either significantly amplify inherent noise or are only effective under specific illumination conditions. To address these issues, we propose a novel framework for simultaneous enhancement and noise suppression under complex illumination conditions. Firstly, a gradient-domain weighted guided filter (GDWGIF) is employed to accurately estimate illumination and improve image quality. Next, the Retinex model is applied to decompose the captured image into separate illumination and reflection layers. These layers undergo parallel processing, with the illumination layer being corrected to optimize lighting conditions and the reflection layer enhanced to improve image quality. Finally, the dynamic range of the image is optimized through multi-exposure fusion and a linear stretching strategy. The proposed method is evaluated on real-world datasets obtained from practical applications. Experimental results demonstrate that our proposed method achieves better performance compared to state-of-the-art methods in both contrast enhancement and noise suppression.

Jing Tao, You Li, Banglei Guan, Yang Shang, Qifeng Yu• 2025

Related benchmarks

TaskDatasetResultRank
Image Quality AssessmentData1
NIQMC5.28
9
Image Quality AssessmentData2
NIQMC4.95
9
Image EnhancementData1
NIQE3.35
9
Image EnhancementData2
NIQE4.11
9
Image Sharpness EvaluationData2 (test)
ARISM (Luminance and Chromatic)1.08
9
Image Sharpness AssessmentData1
ARISM (Luminance)1.21
9
Image Sharpness AssessmentData2
ARISM (luminance only)1.17
9
Image Sharpness EvaluationData1 (test)
ARISM (Luminance & Chromatic)1.11
9
Low-light Image Enhancement100-image synthetic low-light dataset (test)
PSNR32.15
8
Strain MeasurementHigh-temperature static thermal deformation (test)
Epsilon XX Strain232
3
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