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Breaking the Tuning Barrier: Zero-Hyperparameters Yield Multi-Corner Analysis Via Learned Priors

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Yield Multi-Corner Analysis validates circuits across 25+ Process-Voltage-Temperature corners, resulting in a combinatorial simulation cost of $O(K \times N)$ where $K$ denotes corners and $N$ exceeds $10^4$ samples per corner. Existing methods face a fundamental trade-off: simple models achieve automation but fail on nonlinear circuits, while advanced AI models capture complex behaviors but require hours of hyperparameter tuning per design iteration, forming the Tuning Barrier. We break this barrier by replacing engineered priors (i.e., model specifications) with learned priors from a foundation model pre-trained on millions of regression tasks. This model performs in-context learning, instantly adapting to each circuit without tuning or retraining. Its attention mechanism automatically transfers knowledge across corners by identifying shared circuit physics between operating conditions. Combined with an automated feature selector (1152D to 48D), our method matches state-of-the-art accuracy (mean MREs as low as 0.11\%) with zero tuning, reducing total validation cost by over $10\times$.

Wei W. Xing, Kaiqi Huang, Jiazhan Liu, Hong Qiu, Shan Shen• 2026

Related benchmarks

TaskDatasetResultRank
Yield Prediction8x2 SRAM FF corner
Mean Relative Error1
9
Yield Prediction4x2 SRAM TT corner
Yield100
4
Yield Prediction4x2 SRAM FF corner
Yield95
4
Yield Prediction4x2 SRAM SF corner
Y90.9
4
Yield Prediction4x2 SRAM FS corner
Yield100
4
Yield Prediction4x2 SRAM SS corner
Y0.00e+0
4
Yield Prediction8x2 SRAM TT corner
Yield87.1
4
Yield Prediction8x2 SRAM SF corner
Y11.3
4
Yield Prediction8x2 SRAM FS corner
Yield100
4
Yield Prediction8x2 SRAM SS corner
Y (%)0.00e+0
4
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