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Structured Testbench Generation for LLM-Driven HDL Design and Verification-Oriented Data Curation

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Automated testbench generation has become a critical bottleneck in large language model (LLM)-driven Register Transfer Level (RTL) workflows, where large numbers of candidate designs must be verified rapidly and reliably. Existing prompt-based approaches treat testbench generation as unconstrained code synthesis, yielding stochastic outputs with high token cost, low reproducibility, and insufficient coverage. To address this gap, we present STG, a Structured Testbench Generation framework that exploits the inherent structure of hardware designs to generate deterministic testbenches. As a direct verification tool, STG runs 720x faster than an iterative LLM-based testbench generation flow and higher rate of successful compilation, achieves higher coverage, and reduces false-pass verdicts on incorrect DUTs. STG also helps identify errors in RTL generation benchmarks by exposing faulty benchmark testbenches. As a data curation engine, it is 11x faster than LLM-based filtering on a single CPU core with 127x less energy, and the resulting distilled models provide state-of-the-art performance in our multi-benchmark evaluation. As a test-time scaling oracle, it reduces node count by 14-47\%. Our models are available at https://huggingface.co/collections/AS-SiliconMind/siliconmind-v12.

En-Ming Huang, Yu-Hung Kao, Ren-Hao Deng, Wei-Po Hsin, Yao-Ting Hsieh, Cheng Liang, Hsiang-Yu Tsou, Mu-Chi Chen, Yu-Kai Hung, Shao-Chun Ho, Po-Hsuang Huang, Shih-Hao Hung, H.T. Kung• 2026

Related benchmarks

TaskDatasetResultRank
Verilog GenerationVerilogEval v2
Pass@180.2
27
RTL generationRTLLM v2
Pass@168.7
13
RTL generationCVDP
Pass@136.5
12
RTL generationRTLLM VerilogEval CVDP Combined v2
Mean Z-score Pass@1077
12
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