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Probabilistic Signature Inversion: Learning Conditional Distributions from Truncated Signatures

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The signature transform is a principled feature map for continuous-time paths, valued for its uniqueness and universality. Recovering a path from its truncated signature is, however, structurally ill-posed because the truncated signature map is not injective. We therefore reframe truncated signature inversion as a probabilistic problem -- learning the conditional distribution of a path given its truncated signature -- and adopt a signature-conditioned flow matching model as a practical estimator. This probabilistic formulation elucidates the fundamental difficulty of inversion: Bayes reconstruction error quantifies the irreducible uncertainty remaining after conditioning on a statistic. We derive the Bayes-optimal error under linear statistics, obtaining a closed form for log-GBM and numerically tractable formulas for log-fBM and OU, yielding a concrete theoretical baseline for model validation. This baseline upper-bounds the Bayes error under truncated-signature conditioning, since truncated signatures provide richer information than linear statistics. Experiments show that empirical reconstruction errors under linear-statistics conditioning faithfully align with the theory-derived baseline, while errors decrease when the statistic is replaced with truncated signatures. Moreover, generated paths faithfully recover the conditioning signature while preserving key distributional and temporal structures, indicating that the estimator is well-calibrated to the target conditional distribution. Together, these results establish a well-posed probabilistic framework for truncated-signature inversion, with applicability demonstrated on real financial data beyond the parametric process families covered by theory.

Junoh Kang, Kiseop Lee, Bohyung Han• 2026

Related benchmarks

TaskDatasetResultRank
Parameter Estimationlog-GBM processes (synthetic)
Sigma Error0.06
7
Parameter Estimationlog-fBM synthetic processes
Sigma Error0.09
7
Parameter EstimationOU (Ornstein-Uhlenbeck) synthetic processes
Sigma Error0.06
7
Signature fidelitylog-GBM
Relative MSE0.03
7
Signature fidelitylog-fBM
Relative MSE0.03
7
Signature fidelityou
Relative MSE0.01
7
Stylized-fact diagnosticsS&P 500 2009–2022 (In-sample)
Volatility MAE0.02
7
Stylized-fact diagnosticsS&P 500 2023–2025 (Out-of-sample)
Volatility (MAE)0.02
7
Signature fidelityS&P 500 2023–2025 (Out-of-sample)
Relative MSE0.01
7
Signature fidelityS&P 500 2009–2022 (In-sample)
Relative MSE0.01
7
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