Fault Detection on Semiconductor wafers 10000 x 10000 resolution (test)
94.74Accuracy
CNN with collinearity
Updated 1mo ago
Evaluation Results
| Method | Links | ||
|---|---|---|---|
2026.03 | 94.74 | 5.26 | |
| 93.5 | 6.5 | ||
2026.03 | 93.04 | 6.96 |
CNN with collinearity
| Method | Links | ||
|---|---|---|---|
2026.03 | 94.74 | 5.26 | |
| 93.5 | 6.5 | ||
2026.03 | 93.04 | 6.96 |